Was untern drunter steht ist noch interessanter und wichtiger.
3. Although each I/O port can sink more than the test conditions (20 mA at VCC = 5V, 10 mA at VCC = 3V) under steady state
conditions (non-transient), the following must be observed:
TQFP and QFN/MLF Package:
1] The sum of all IOL, for all ports, should not exceed 400 mA.
2] The sum of all IOL, for ports A0 - A7, G2, C3 - C7 should not exceed 100 mA.
3] The sum of all IOL, for ports C0 - C2, G0 - G1, D0 - D7, XTAL2 should not exceed 100 mA.
4] The sum of all IOL, for ports B0 - B7, G3 - G4, E0 - E7 should not exceed 100 mA.
5] The sum of all IOL, for ports F0 - F7, should not exceed 100 mA.
If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater
than the listed test condition.
4. Although each I/O port can source more than the test conditions (20 mA at Vcc = 5V, 10 mA at Vcc = 3V) under steady state
conditions (non-transient), the following must be observed:
TQFP and QFN/MLF Package:
1] The sum of all IOH, for all ports, should not exceed 400 mA.
2] The sum of all IOH, for ports A0 - A7, G2, C3 - C7 should not exceed 100 mA.
3] The sum of all IOH, for ports C0 - C2, G0 - G1, D0 - D7, XTAL2 should not exceed 100 mA.
4] The sum of all IOH, for ports B0 - B7, G3 - G4, E0 - E7 should not exceed 100 mA.
5] The sum of all IOH, for ports F0 - F7, should not exceed 100 mA.
If IOH exceeds the test condition, VOH may exceed the related specification. Pins are not guaranteed to source current
greater than the listed test condition.